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Fix WH unit tests under T3K #533

Merged
merged 2 commits into from
Feb 24, 2025
Merged

Fix WH unit tests under T3K #533

merged 2 commits into from
Feb 24, 2025

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joelsmithTT
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Issue

#532

Description

These tests hard-code simulated harvesting masks for only two chips, causing the tests to fail on T3K systems (which have four N300 cards).

List of the changes

Generate a simulated harvesting mask for all chips.

Testing

Manual

API Changes

There are no API changes in this PR.

@broskoTT
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Awesome, thanks @joelsmithTT !

@joelsmithTT joelsmithTT enabled auto-merge (squash) February 24, 2025 13:48
@joelsmithTT joelsmithTT merged commit c7ff33b into main Feb 24, 2025
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@joelsmithTT joelsmithTT deleted the joelsmith/t3k branch February 24, 2025 14:14
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4 participants