#9993: Disable flaky test in SD mode

tenstorrent · Jul 8, 2024 · 9506160 · 9506160
1 parent 9c21cd2
commit 9506160
Showing 2 changed files with 8 additions and 0 deletions.
diff --git a/tests/tt_metal/tt_metal/unit_tests_common/watcher/test_pause.cpp b/tests/tt_metal/tt_metal/unit_tests_common/watcher/test_pause.cpp
@@ -127,6 +127,10 @@ static void RunTest(WatcherFixture* fixture, Device* device) {
 }
 
 TEST_F(WatcherFixture, TestWatcherPause) {
+    if (this->IsSlowDispatch()) {
+        log_info(tt::LogTest, "Skip, see #9993");
+        GTEST_SKIP();
+    }
     for (Device* device : this->devices_) {
         this->RunTestOnDevice(RunTest, device);
     }

diff --git a/tests/tt_metal/tt_metal/unit_tests_common/watcher/test_ringbuf.cpp b/tests/tt_metal/tt_metal/unit_tests_common/watcher/test_ringbuf.cpp
@@ -192,6 +192,10 @@ TEST_F(WatcherFixture, TestWatcherRingBufferIErisc) {
         log_info(tt::LogTest, "Skip due to #7771");
         GTEST_SKIP();
     }
+    if (this->IsSlowDispatch()) {
+        log_info(tt::LogTest, "Skip, see #9993");
+        GTEST_SKIP();
+    }
     for (Device* device : this->devices_) {
         this->RunTestOnDevice(
             [](WatcherFixture *fixture, Device *device){RunTest(fixture, device, DebugIErisc);},