(Single-card) Device perf regressions

(Single-card) Device perf regressions #3187

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Triggered via schedule October 18, 2024 02:25

tt-rkim

main

Status Failure

Total duration 1h 10m 30s

Artifacts 3

perf-device-models.yaml

on: schedule

build-artifact-profiler / ... / build-docker-image

Matrix: build-artifact-profiler / build-artifact

Matrix: device-perf / device-perf

Annotations

2 errors

device-perf / N300 WH B0 device perf

Process completed with exit code 1.

device-perf / N300 WH B0 device perf

Process completed with exit code 2.

Artifacts

Produced during runtime

Name	Size
TTMetal_build_grayskull_profiler Expired	51.1 MB
TTMetal_build_wormhole_b0_profiler Expired	51.1 MB
device-perf-report-csv-grayskull-bare_metal Expired	1.05 KB